Riede, W. and Gruenewald, K.M. (2002) Large-spot COIL irradiation of Ge samples. Boulder Damage Symposium, Boulder, Colorado, USA, 16-18 September 2002.
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The large-spot out-of-band irradiation of Ge wafers and subsequent evaluation is discussed in this paper. The wafers were irradiated with a high-power, cw COIL system, operating at a wavelength of 1.315 µm. Damaging fluence values on the order of 1 kJ/cm2 were found for irradiation periods of several seconds. Thermal simulations were consistent with experimental findings. The damage morphology showed melt and microcrystallites. For sample evaluation, a compact modulation transfer function (MTF) test bench has been developed.
|Document Type:||Conference or Workshop Item (Paper)|
|Title:||Large-spot COIL irradiation of Ge samples|
|Keywords:||Keywords: Large-spot irradiation, Ge wafers, COIL, MTF test bench|
|Event Title:||Boulder Damage Symposium, Boulder, Colorado, USA, 16-18 September 2002|
|HGF - Research field:||Energy|
|HGF - Program:||Aeronautics|
|HGF - Program Themes:||other|
|DLR - Research area:||Energy|
|DLR - Program:||L - no assignement|
|DLR - Research theme (Project):||L - Laser Research and Technology|
|Institutes and Institutions:||Institute of Technical Physics|
|Deposited By:||Dr.rer.nat. Hans-Albert Eckel|
|Deposited On:||16 Sep 2005|
|Last Modified:||06 Jan 2010 14:48|
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