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Large-spot COIL irradiation of Ge samples

Riede, W. and Gruenewald, K.M. (2002) Large-spot COIL irradiation of Ge samples. Boulder Damage Symposium, Boulder, Colorado, USA, 16-18 September 2002.

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Abstract

The large-spot out-of-band irradiation of Ge wafers and subsequent evaluation is discussed in this paper. The wafers were irradiated with a high-power, cw COIL system, operating at a wavelength of 1.315 µm. Damaging fluence values on the order of 1 kJ/cm2 were found for irradiation periods of several seconds. Thermal simulations were consistent with experimental findings. The damage morphology showed melt and microcrystallites. For sample evaluation, a compact modulation transfer function (MTF) test bench has been developed.

Document Type:Conference or Workshop Item (Paper)
Additional Information: LIDO-Berichtsjahr=2003,
Title:Large-spot COIL irradiation of Ge samples
Authors:
AuthorsInstitution or Email of Authors
Riede, W.UNSPECIFIED
Gruenewald, K.M.UNSPECIFIED
Date:2002
Status:Published
Keywords:Keywords: Large-spot irradiation, Ge wafers, COIL, MTF test bench
Event Title:Boulder Damage Symposium, Boulder, Colorado, USA, 16-18 September 2002
Organizer:SPIE
HGF - Research field:Energy
HGF - Program:Aeronautics
HGF - Program Themes:other
DLR - Research area:Energy
DLR - Program:L - no assignement
DLR - Research theme (Project):L - Laser Research and Technology
Location: Stuttgart
Institutes and Institutions:Institute of Technical Physics
Deposited By: Dr.rer.nat. Hans-Albert Eckel
Deposited On:16 Sep 2005
Last Modified:06 Jan 2010 14:48

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