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Coexistence of Thermal Noise and Squeezing in the Intensity Fluctuations of Small Laser Diodes

Hofmann, H. F. and Hess, O. (2000) Coexistence of Thermal Noise and Squeezing in the Intensity Fluctuations of Small Laser Diodes. Journal of the Optical Society of America, B (17), pp. 1926-1933.

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Document Type:Article
Additional Information: LIDO-Berichtsjahr=2001,
Title:Coexistence of Thermal Noise and Squeezing in the Intensity Fluctuations of Small Laser Diodes
Authors:
AuthorsInstitution or Email of Authors
Hofmann, H. F.UNSPECIFIED
Hess, O.UNSPECIFIED
Date:2000
Journal or Publication Title:Journal of the Optical Society of America
Refereed publication:Yes
In ISI Web of Science:Yes
Volume:B
Page Range:pp. 1926-1933
Status:Published
HGF - Research field:Energy
HGF - Program:Aeronautics
HGF - Program Themes:other
DLR - Research area:Energy
DLR - Program:L - no assignement
DLR - Research theme (Project):L - Laser Research and Technology
Location: Stuttgart
Institutes and Institutions:Institute of Technical Physics
Deposited By: elib DLR-Beauftragter
Deposited On:16 Sep 2005
Last Modified:06 Jan 2010 14:42

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