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Optical thickness estimation using MOS data

Pflug, B. and Krawczyk, H. and Gerasch, B. (2000) Optical thickness estimation using MOS data. Journal of Spacecraft Technology, 10 (2), pp. 14-18.

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Abstract

Present status of algorithms for atmospheric correction of ocean colour observations from space is demonstrated using data of imaging spectrometers MOS. Spectrometer MOS-A is used to identify high altitude transparent scattering layers, which can significantly reduce accuracy of atmospheric correction. Spectrometer MOS-B is used for estimation of aerosol optical thickness and Angstrom-exponent.

Document Type:Article
Additional Information: LIDO-Berichtsjahr=1999,
Title:Optical thickness estimation using MOS data
Authors:
AuthorsInstitution or Email of Authors
Pflug, B.UNSPECIFIED
Krawczyk, H.UNSPECIFIED
Gerasch, B.UNSPECIFIED
Date:2000
Journal or Publication Title:Journal of Spacecraft Technology
Refereed publication:Yes
In ISI Web of Science:Yes
Volume:10
Page Range:pp. 14-18
Status:Published
Keywords:Imaging spectrometer MOS; Atmospheric correction; Aerosol optical tickness; Angstrom-exponent
HGF - Research field:Aeronautics, Space and Transport (old)
HGF - Program:Space (old)
HGF - Program Themes:W EO - Erdbeobachtung
DLR - Research area:Space
DLR - Program:W EO - Erdbeobachtung
DLR - Research theme (Project):UNSPECIFIED
Location: Berlin-Adlershof
Institutes and Institutions:Institut für Weltraumsensorik und Planetenerkundung
Deposited By: elib DLR-Beauftragter
Deposited On:16 Sep 2005
Last Modified:14 Jan 2010 18:28

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