Generating microstructure models of materials for numerical analyses by means of X-ray tomography and FIB-slicing

Kurzfassung

Properties of materials with a complex microstructure are defined by the properties and the arrangement of the microstructural constituents. The presentation will show on the example of an all oxide porous ceramic matrix composite (CMC) the steps from deriving 3-dimensional microstructure data on different length scales to the generation of numerical models, suitable for finite element analyses. For different length scales two methods are utilized - non-destructive X-ray tomography in the range from mm to μm and combined sequential focused ion beam (FIB) ablation and scanning electron microscopy in the submicron range.