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Evaluation and Qualification of RadHard Infineon Power MOSFETs

Joormann, Guido (2012) Evaluation and Qualification of RadHard Infineon Power MOSFETs. Microelectronics Workshop (MEWS 25), 2012-11-01 - 2012-11-02, Tsukuba, Japan.

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Kurzfassung

In electronic space equipment Power-MOSFETs are needed almost everywhere. However, these parts are sensitive to space radiation. There is currently only one space qualified U.S. manufacturer of radiation hardened power MOSFETs worldwide. In addition, the products are subject to the very stringent export regulations of the US State Department. Thus, the success of the European Space Industry is restricted strongly by the U.S. supply. That is why Europe has been trying for a long time to develop a Power-MOSFET technology. For several years, DLR is conducting development projects in this area. By now we are able to present positive results. Fundamental studies were carried out with the aim to select the most appropriate technology at Infineon and to identify simple process modifications that allow the desired improvement in radiation resistance. The Cool-MOS transistor was identified as the best suited component for radiation hardening. The results have shown that there is no single measure that will allow to attain the goal of radiation-hardened MOSFETs on the existing process line in the short-term. Rather, it was recognized that fundamental changes need to be introduced to the commercial process to realise the desired radiation resistance for the Cool-MOS transistor. In addition a short overview on running parts activities at DLR will be given.

elib-URL des Eintrags:https://elib.dlr.de/111641/
Dokumentart:Konferenzbeitrag (Vortrag)
Titel:Evaluation and Qualification of RadHard Infineon Power MOSFETs
Autoren:
AutorenInstitution oder E-Mail-AdresseAutoren-ORCID-iDORCID Put Code
Joormann, Guidoguido.joormann (at) dlr.dehttps://orcid.org/0000-0001-7688-7232NICHT SPEZIFIZIERT
Datum:2 November 2012
Referierte Publikation:Nein
Open Access:Ja
Gold Open Access:Nein
In SCOPUS:Nein
In ISI Web of Science:Nein
Status:veröffentlicht
Stichwörter:Radiation Hardened (RadHard) Power MOSFETs, Qualification, EEE-Parts, Mosfet, space equipment, radhard, radiation resistance
Veranstaltungstitel:Microelectronics Workshop (MEWS 25)
Veranstaltungsort:Tsukuba, Japan
Veranstaltungsart:Workshop
Veranstaltungsbeginn:1 November 2012
Veranstaltungsende:2 November 2012
Veranstalter :JAXA
HGF - Forschungsbereich:Luftfahrt, Raumfahrt und Verkehr
HGF - Programm:Raumfahrt
HGF - Programmthema:keine Zuordnung
DLR - Schwerpunkt:Raumfahrt
DLR - Forschungsgebiet:R - keine Zuordnung
DLR - Teilgebiet (Projekt, Vorhaben):R - keine Zuordnung
Standort: Köln-Porz
Institute & Einrichtungen:Qualitäts- und Produktsicherung > Normung und EEE-Bauteile
Hinterlegt von: Joormann, Guido
Hinterlegt am:21 Apr 2017 15:14
Letzte Änderung:24 Apr 2024 20:16

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